Title :
An ultra-wideband autocorrelation demodulation scheme with low-complexity time reversal enhancement
Author :
Guo, N. ; Qiu, Robert C. ; Sadler, B.M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Tennessee Technol. Univ., Cookeville, TN, USA
Abstract :
This paper presents a low-complexity time reversal technique as an enhancement for the ultra-wideband (UWB) communication system over ISI channels, time reversal takes advantage of rich channel impulse response (CIR) to achieve signal focusing in both time domain and spatial domain. But implementing time reversal for UWB applications is extremely challenging. Aiming at designing a practical low-complexity UWB communication system, an autocorrelation demodulation (ACD) scheme with time reversal enhancement is considered. Nonlinear inter-symbol-interference (ISI) channel model and bit error rate (BER) formulae are derived. Major implementation related issues are discussed. Based on our numerical results, we find that the proposed simplified time reversal enhancement does work and significant gain over ordinary ACD scheme can be obtained in ISI scenarios. In addition, location based security supported by time reversal´s spatial focusing property is also examined.
Keywords :
correlation theory; demodulation; error statistics; intersymbol interference; telecommunication channels; telecommunication security; time-domain analysis; transient response; ultra wideband communication; ACD; BER; CIR; ISI channel; UWB system; autocorrelation demodulation scheme; bit error rate; channel impulse response; location based security; nonlinear intersymbol-interference; signal focusing; spatial domain analysis; time domain analysis; time reversal enhancement; ultrawideband communication; Autocorrelation; Bit error rate; Computer aided manufacturing; Demodulation; Intersymbol interference; Laboratories; Propagation delay; Pulp manufacturing; Transmitters; Ultra wideband technology;
Conference_Titel :
Military Communications Conference, 2005. MILCOM 2005. IEEE
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-9393-7
DOI :
10.1109/MILCOM.2005.1606130