DocumentCode :
3400282
Title :
Stencil deformation during stencil printing
Author :
Krammer, Olivér ; Molnár, László-Milán ; Jakab, László ; Klein, Christian
Author_Institution :
Dept. of Electron. Technol., Budapest Univ. of Technol. & Econ., Budapest, Hungary
fYear :
2009
fDate :
17-20 Sept. 2009
Firstpage :
179
Lastpage :
184
Abstract :
Uneven solder mask thickness or other artifacts on PCBs can keep the stencil away from the PCB during stencil printing, which cause large deposited solder paste volume, and can result in solder bridges after reflow soldering. In our experiment we have investigated the deformation properties of stencils. The load-strain curve of a 125 ¿m thick stainless steel stencil was measured on nine locations. By the deformation experiments, the FEM (Finite Element Method) model of the stencil was created. With FEM simulations, the minimum technological distances (distance between artifacts and solder pads) for a range of step heights (difference between artifact height and pad height) and for different stencil thicknesses were determined. With the adherence to this technological distance, the stencil can bend down to the pad, and the proper amount of solder paste can be deposited onto the pad.
Keywords :
deformation; finite element analysis; masks; printed circuit manufacture; soldering; stainless steel; PCB; deformation properties; finite element method model; load-strain curve; reflow soldering; solder bridges; solder mask thickness; solder paste volume; stainless steel stencil; stencil deformation; stencil printing; stencil thickness; technological distance; Apertures; Assembly; Automotive electronics; Bridge circuits; Clocks; Electronics packaging; Printing; Reflow soldering; Semiconductor device modeling; Thickness measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design and Technology of Electronics Packages, (SIITME) 2009 15th International Symposium for
Conference_Location :
Gyula
Print_ISBN :
978-1-4244-5132-6
Electronic_ISBN :
978-1-4244-5133-3
Type :
conf
DOI :
10.1109/SIITME.2009.5407378
Filename :
5407378
Link To Document :
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