A novel LCD driver testing technique using logic test channels

Author

Su, Chauchin ; Wang, Wei-Juo ; Wang, Chih-Hu ; Tseng, I.S.

Author_Institution

Dept. of Electr. & Control Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan

fYear

2003

fDate

21-24 Jan. 2003

Firstpage

657

Lastpage

662

Abstract

This paper proposes a novel voltage measurement technique for LCD driver testing by the use of the logic test channel of an ATE. The method is able to achieve less than 1 mV error with the presence of 32 mV RMS noise.

Keywords

automatic test equipment; driver circuits; error analysis; integrated circuit noise; integrated circuit testing; liquid crystal displays; logic testing; measurement errors; voltage measurement; 32 mV; ATE; LCD driver testing technique; RMS noise; logic test channels; measurement error; voltage measurement technique; Cellular phones; Centralized control; Circuit testing; Computer errors; Driver circuits; Liquid crystal displays; Logic testing; Phasor measurement units; Portable computers; Voltage measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Design Automation Conference, 2003. Proceedings of the ASP-DAC 2003. Asia and South Pacific

Print_ISBN

0-7803-7659-5

Type

conf

DOI

10.1109/ASPDAC.2003.1195104

Filename

1195104

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3400584