DocumentCode
3400642
Title
Calculation of the internal hottest temperature about running power capacitor
Author
Liu, Wenze ; Cai, Zexiang ; Feng, Shunping ; Liu, Gang
Author_Institution
Coll. of Electr. Eng., South China Univ. of Technol., Guangzhou, China
fYear
2009
fDate
19-23 July 2009
Firstpage
126
Lastpage
129
Abstract
The shunt power capacitor is widely used in power system as the reactive power compensation. To estimate the internal hottest-spot temperature of a running power capacitor, it is put forward the calculate model of the hottest-spot temperature of the capacitor inner, which deals the hottest temperature of capacitor shell as the intermediate variable in the balance of heat change. In service, the dielectric loss causes the capacitor´s temperature rise. The internal hottest temperature of a power capacitor is an important factor to damage the dielectric in long running. According to the parameters of one power capacitor, the calculation result of the internal hottest temperature is calculated with different running power capacity under several ambient temperatures. The field temperatures of a capacitor bank are measured using a thermal infrared image instrument. The validity of the calculation model is verified by the measurement data. The ambient temperature proposals are offered to strengthen the running safety of the shunt power capacitor.
Keywords
dielectric losses; power capacitors; reactive power control; temperature control; thermal stability; capacitor bank; dielectric loss; internal hottest temperature; reactive power compensation; running power capacitor; shunt power capacitor; thermal infrared image instrument; Dielectric losses; Dielectric measurements; Infrared imaging; Instruments; Power capacitors; Power system modeling; Proposals; Reactive power; Safety; Temperature; Calculation model; Dielectric loss; Hottest temperature; Power capacitor; Running capacity;
fLanguage
English
Publisher
ieee
Conference_Titel
Properties and Applications of Dielectric Materials, 2009. ICPADM 2009. IEEE 9th International Conference on the
Conference_Location
Harbin
Print_ISBN
978-1-4244-4367-3
Electronic_ISBN
978-1-4244-4368-0
Type
conf
DOI
10.1109/ICPADM.2009.5252489
Filename
5252489
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