Title :
Pulsed stress behavior of PEDOT:PSS thin films
Author :
Bonfert, D. ; Klink, G. ; Bock, K. ; Svasta, P. ; Ionescu, Clara
Author_Institution :
Fraunhofer Inst. Reliability & Microintegration (FhG - IZM-M), Munich, Germany
Abstract :
There is a necessity to include sensors (resistors) in the design of organic electronic devices in order to extend the range of possible applications, mentioned in the last iNEMI roadmap. It is essential to identify potential organic resistive materials, the processes and methods to structure them and to characterize their resistive properties on flexible substrates. A material widely used in organic electronics is the intrinsically conductive polymer (ICP) poly (3, 4-ethylendioxythiophene) doped with polystyrene sulfonate acid (PEDOT:PSS). In this paper we focus on the pulsed stress behavior of this conductive polymer, normally used as a conductive layer and the resulting changes of the resistive properties.
Keywords :
conducting polymers; electrostatic discharge; flexible electronics; nondestructive testing; organic semiconductors; polymer films; PEDOT:PSS thin films; electrostatic discharge; intrinsically conductive polymer; organic electronics; poly (3, 4-ethylendioxythiophene); polystyrene sulfonate acid; pulsed stress behavior; Stress; Transistors;
Conference_Titel :
Design and Technology of Electronics Packages, (SIITME) 2009 15th International Symposium for
Conference_Location :
Gyula
Print_ISBN :
978-1-4244-5132-6
Electronic_ISBN :
978-1-4244-5133-3
DOI :
10.1109/SIITME.2009.5407397