Title :
An image watermarking technique with improved resistance to geometric distortions using image feature points
Author :
Yasein, Mohamed S. ; Agathoklis, Pan
Author_Institution :
Dept. of Comp. Sci., Suez Canal Univ., Ismailia, Egypt
Abstract :
A blind image watermarking technique with improved robustness to geometric distortions is proposed. The technique relies on geometric properties of image feature points, which are extracted using a feature point extractor based on scale-interaction of Mexican-hat wavelets. These feature points are used to obtain geometric normalization parameters during the embedding process which are used to compensate for geometric distortions during the watermark detection process. Experimental results illustrate the robustness of the proposed technique to geometric attacks in addition to several common image-processing operations.
Keywords :
feature extraction; image processing; watermarking; wavelet transforms; Mexican-hat wavelets; blind image watermarking; feature point extractor; geometric distortions; geometric normalization parameters; geometric properties; image feature points; image processing operations; scale-interaction; Computational complexity; Computer vision; Degradation; Detectors; Digital images; Feature extraction; Image processing; Irrigation; Robustness; Watermarking; feature points; geometric distortions; watermarking;
Conference_Titel :
Signal Processing and Information Technology (ISSPIT), 2009 IEEE International Symposium on
Conference_Location :
Ajman
Print_ISBN :
978-1-4244-5949-0
DOI :
10.1109/ISSPIT.2009.5407479