Title :
Application of complex technological optimization for monolithic microwave circuits designing
Author :
Gudkov, A.G. ; Leushin, V.Yu. ; Meshkov, S.A. ; Popov, V.V.
Author_Institution :
Hyperion Ltd., Moscow
Abstract :
The development problem of methods and features of complex technological optimization is considered, i.e. the interconnected choice of probability of activities of functions by party microwave MMIC per unit time, tolerance of output electrical quantities (function indexes), faultiness probability and guaranteed quality of party and individual samples of microwave MIC is put using existing technologies and without updating their structure and parameters.
Keywords :
MMIC; complex technological optimization; faultiness probability; guaranteed quality; microwave MMIC; monolithic microwave circuits designing; output electrical quantities; tolerance; Design optimization; Helium; IEEE catalog; Indium tin oxide; Microwave circuits; Microwave technology; Organizing;
Conference_Titel :
Microwave & Telecommunication Technology, 2008. CriMiCo 2008. 2008 18th International Crimean Conference
Conference_Location :
Sevastopol, Crimea
Print_ISBN :
978-966-335-166-7
Electronic_ISBN :
978-966-335-169-8
DOI :
10.1109/CRMICO.2008.4676491
