DocumentCode
3401041
Title
Application of complex technological optimization for monolithic microwave circuits designing
Author
Gudkov, A.G. ; Leushin, V.Yu. ; Meshkov, S.A. ; Popov, V.V.
Author_Institution
Hyperion Ltd., Moscow
fYear
2008
fDate
8-12 Sept. 2008
Firstpage
535
Lastpage
536
Abstract
The development problem of methods and features of complex technological optimization is considered, i.e. the interconnected choice of probability of activities of functions by party microwave MMIC per unit time, tolerance of output electrical quantities (function indexes), faultiness probability and guaranteed quality of party and individual samples of microwave MIC is put using existing technologies and without updating their structure and parameters.
Keywords
MMIC; complex technological optimization; faultiness probability; guaranteed quality; microwave MMIC; monolithic microwave circuits designing; output electrical quantities; tolerance; Design optimization; Helium; IEEE catalog; Indium tin oxide; Microwave circuits; Microwave technology; Organizing;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave & Telecommunication Technology, 2008. CriMiCo 2008. 2008 18th International Crimean Conference
Conference_Location
Sevastopol, Crimea
Print_ISBN
978-966-335-166-7
Electronic_ISBN
978-966-335-169-8
Type
conf
DOI
10.1109/CRMICO.2008.4676491
Filename
4676491
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