DocumentCode :
3401060
Title :
Influence of cable terminal stress cone install incorrectly
Author :
Chen, Chengwei ; Liu, Gang ; Lu, Guojun ; Wang Jin
Author_Institution :
Sch. of Electr. Power, South China Univ. of Technol., Guangzhou, China
fYear :
2009
fDate :
19-23 July 2009
Firstpage :
63
Lastpage :
65
Abstract :
The electric field intensity around the power cable terminal is computed based on the finite element method when the power cable is loaded on the 110 kV constant voltage source. If the power cable terminal is installed correctly, the stress cone covers the outer semi-conducting layers 60 mm. 3 models of the power cable terminal installed incorrectly are computed, such as the stress cone covers the outer semi-conducting layers 50 mm, 46 mm, 73 mm, based on the finite element method to analyze the electric field distorted. The models were computed when loaded on the 110 kV constant voltage source. The results shown that, when stress cone covered the outer semiconducting more than 60 mm, the local electrical field distorted and the electric-field intensity increasing sharp. It is ruinous for the insulation materials when the local electrical field is distorted for the intensity exceeding the dielectric strength possibly. In the test, 3 models such as the stress cone covers the outer semi-conducting layers 50 mm, 46 mm, 73 mm run with U0 constant voltage source or more than U0. There were high partial discharge in the model which the stress cone covers the outer semi-conducting layers 73 mm. Tests proved the analysis were right. Stress cone which covers semi-conducting too more are harmful to the safe operation of electrical equipment.
Keywords :
electric connectors; electric strength; finite element analysis; insulating materials; power cables; dielectric strength; electric field intensity; finite element method; insulation materials; partial discharge; power cable terminal; size 46 mm to 73 mm; size 60 mm; stress cone; voltage 110 kV; Dielectric breakdown; Dielectric materials; Dielectrics and electrical insulation; Finite element methods; Power cables; Semiconductivity; Semiconductor materials; Stress; Testing; Voltage; electrostatic field; finite element method; install incorrectly; power cable´s terminal; stress cone; the test;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Properties and Applications of Dielectric Materials, 2009. ICPADM 2009. IEEE 9th International Conference on the
Conference_Location :
Harbin
Print_ISBN :
978-1-4244-4367-3
Electronic_ISBN :
978-1-4244-4368-0
Type :
conf
DOI :
10.1109/ICPADM.2009.5252506
Filename :
5252506
Link To Document :
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