DocumentCode
3401066
Title
Microwave methods of ferroelectrics and related materials investigation
Author
Poplavko, Y. ; Molchanov, V. ; Pashkov, V. ; Kazmirenko, V.
Author_Institution
Nat. Tech. Univ. of Ukraine, Kiev
fYear
2008
fDate
8-12 Sept. 2008
Firstpage
539
Lastpage
541
Abstract
Ferroelectric materialspsila distinct feature is large dielectric permittivity epsiv which sometimes is accompanied by the large loss tangent tandelta. Often this becomes an obstacle to conduct their accurate characterization despite of variety of techniques available. This report is devoted to the selection of proper method for specific cases of bulk or film materials investigation to obtain reliable data of their epsiv and tandelta.
Keywords
dielectric losses; ferroelectric materials; ferroelectric thin films; microwave measurement; permittivity; bulk materials; dielectric permittivity; ferroelectrics; film materials; loss tangent; microwave methods; Capacitors; Dielectric loss measurement; Dielectric losses; Dielectric materials; Dielectric measurements; Dielectric substrates; Ferroelectric films; Ferroelectric materials; Microwave measurements; Microwave theory and techniques;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave & Telecommunication Technology, 2008. CriMiCo 2008. 2008 18th International Crimean Conference
Conference_Location
Sevastopol, Crimea
Print_ISBN
978-966-335-166-7
Electronic_ISBN
978-966-335-169-8
Type
conf
DOI
10.1109/CRMICO.2008.4676493
Filename
4676493
Link To Document