• DocumentCode
    340123
  • Title

    Spatial analysis of the electromagnetic bias in radar altimetry

  • Author

    Smith, Justin D. ; Arnold, David V.

  • Author_Institution
    Brigham Young Univ., Provo, UT, USA
  • Volume
    1
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    601
  • Abstract
    Measurements of the electromagnetic bias have shown that bias increases with wind speed until about 11 m/s and then begins to decrease. Two possible causes are investigated. First, it could be due to a shift in the backscatter power modulation to the forward or rear face of the wave crests. Second, it could be due to the backscatter power becoming more homogenous throughout the wave profile. These two possibilities are tested using data collected from an oil platform in the Gulf of Mexico during a six-month period in 1990. This study is novel because it uses knowledge of the spatial distribution of both the backscatter and wave displacement for the study of the electromagnetic bias. Both causes outlined above contribute to the bias decrease, but the second cause seems to be the dominant effect. This study is in support of the upcoming mission of the NASA/CNES Jason-1 altimeter
  • Keywords
    atmospheric techniques; backscatter; ocean waves; oceanographic techniques; radar cross-sections; remote sensing by radar; spaceborne radar; wind; AD 1990; CNES; Gulf of Mexico; Jason-1 altimeter; NASA; atmosphere; backscatter; backscatter power modulation; electromagnetic bias; marine boundary layer; measurement technique; ocean wave; radar altimetry; radar remote sensing; radar scattering; sea surface; spatial analysis; spatial distribution; wave crest; wave displacement; wave profile; wind; wind speed; Altimetry; Backscatter; Electromagnetic analysis; Electromagnetic measurements; Electromagnetic scattering; Offshore installations; Radar; Testing; Velocity measurement; Wind speed;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium, 1999. IGARSS '99 Proceedings. IEEE 1999 International
  • Conference_Location
    Hamburg
  • Print_ISBN
    0-7803-5207-6
  • Type

    conf

  • DOI
    10.1109/IGARSS.1999.773578
  • Filename
    773578