Title :
Efficient BIST design for sequential machines using FiF-FoF values in machine states
Author :
Roy, S. ; Maulik, U. ; Bandyopadhyay, S. ; Basu, S. ; Sikdar, Biplab K.
Author_Institution :
Dept. of Comput. Sci. & Technol., Kalyani Gov. Eng. Coll., India
Abstract :
This paper introduces a novel BIST-quality metric termed the FiF-FoF (fan-in-factor and fan-out-factor) defined on PSM-states. Based on the FiF-FoF analysis, an efficient scheme is presented that ensures all state codes appear with uniform likelihood at the present state (PS) lines during the test phase. This results in higher fault efficiency in a BIST structure. Experimental results on MCNC benchmarks show that the scheme improves fault efficiency of sequential circuits significantly, with marginal area overhead.
Keywords :
built-in self test; fault location; finite state machines; integrated circuit testing; logic testing; sequential circuits; sequential machines; BIST design; BIST structure; BIST-quality metric; FiF-FoF analysis; FiF-FoF values; MCNC benchmarks; fan-in-factor; fan-out-factor; fault efficiency; machine states; marginal area overhead; present state lines; sequential circuits; sequential machines; state code likelihood; test phase; Benchmark testing; Built-in self-test; Circuit faults; Circuit synthesis; Circuit testing; Computer science; Machine intelligence; Paper technology; Sequential circuits; Strontium;
Conference_Titel :
Design Automation Conference, 2003. Proceedings of the ASP-DAC 2003. Asia and South Pacific
Print_ISBN :
0-7803-7659-5
DOI :
10.1109/ASPDAC.2003.1195140
