DocumentCode :
3401403
Title :
Throughput time forecasting model
Author :
Raddon, Aaron ; Grigsby, Barry
Author_Institution :
Intel Corp., Rio Rancho, NM, USA
fYear :
1997
fDate :
10-12 Sep 1997
Firstpage :
430
Lastpage :
433
Abstract :
Market conditions continually force the need to increase operational performance through increased equipment utilization and productivity. Fab 7 ramped a perceived full Fab by an additional 25% in order to meet a growing Flash market. The additional load on the factory incurred an unanticipated increase in Fab Throughput Time (TPT). It was obvious that a change in forecasting methodology was required. A model to forecast the TPT based on the Long Range Plan (LRP) was developed. The TPT model has increased Fab 7´s ability to more accurately predict die-out commitments. Moreover, the model increased predictability of TPT (+/-2 days) from 50% to 100%. Finally, the model has provided a business tool to evaluate factory parameter trade-offs
Keywords :
forecasting theory; integrated circuit manufacture; Fab 7 factory; business tool; equipment utilization; flash memory manufacture; forecasting model; long range plan; predictability; productivity; semiconductor fab; throughput time; Continuous improvement; Costs; Data analysis; Demand forecasting; Economic forecasting; Manufacturing; Predictive models; Production facilities; Productivity; Throughput;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Semiconductor Manufacturing Conference and Workshop, 1997. IEEE/SEMI
Conference_Location :
Cambridge, MA
ISSN :
1078-8743
Print_ISBN :
0-7803-4050-7
Type :
conf
DOI :
10.1109/ASMC.1997.630775
Filename :
630775
Link To Document :
بازگشت