DocumentCode
3401591
Title
A novel riemannian framework for shape analysis of 3D objects
Author
Kurtek, Sebastian ; Klassen, Eric ; Ding, Zhaohua ; Srivastava, Anuj
Author_Institution
Dept. of Stat., Florida State Univ., Tallahassee, FL, USA
fYear
2010
fDate
13-18 June 2010
Firstpage
1625
Lastpage
1632
Abstract
In this paper we introduce a novel Riemannian framework for shape analysis of parameterized surfaces. We derive a distance function between any two surfaces that is invariant to rigid motion, global scaling, and re-parametrization. It is the last part that presents the main difficulty. Our solution to this problem is twofold: (1) we define a special representation, called a q-map, to represent each surface, and (2) we develop a gradient-based algorithm to optimize over different re-parameterizations of a surface. The second step is akin to deforming the mesh on a fixed surface to optimize its placement. (This is different from the current methods that treat the given meshes as fixed.) Under the chosen representation, with the L2 metric, the action of the re-parametrization group is by isometries. This results in, to our knowledge, the first Riemannian distance between parameterized surfaces to have all the desired invariances. We demonstrate this framework with several examples using some toy shapes, and real data with anatomical structures, and cropped facial surfaces. We also successfully demonstrate clustering and classification of these objects under the proposed metric.
Keywords
computer graphics; computer vision; gradient methods; shape recognition; 3D objects; Riemannian framework; anatomical structures; computer vision; cropped facial surfaces; distance function; global scaling; gradient-based algorithm; image analysis; q-map; re-parametrization group; rigid motion; shape analysis; Anatomical structure; Computer displays; Humans; Image analysis; Mathematics; Optimization methods; Shape; Statistical analysis; Surface reconstruction; Surface treatment;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision and Pattern Recognition (CVPR), 2010 IEEE Conference on
Conference_Location
San Francisco, CA
ISSN
1063-6919
Print_ISBN
978-1-4244-6984-0
Type
conf
DOI
10.1109/CVPR.2010.5539778
Filename
5539778
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