• DocumentCode
    3401591
  • Title

    A novel riemannian framework for shape analysis of 3D objects

  • Author

    Kurtek, Sebastian ; Klassen, Eric ; Ding, Zhaohua ; Srivastava, Anuj

  • Author_Institution
    Dept. of Stat., Florida State Univ., Tallahassee, FL, USA
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    1625
  • Lastpage
    1632
  • Abstract
    In this paper we introduce a novel Riemannian framework for shape analysis of parameterized surfaces. We derive a distance function between any two surfaces that is invariant to rigid motion, global scaling, and re-parametrization. It is the last part that presents the main difficulty. Our solution to this problem is twofold: (1) we define a special representation, called a q-map, to represent each surface, and (2) we develop a gradient-based algorithm to optimize over different re-parameterizations of a surface. The second step is akin to deforming the mesh on a fixed surface to optimize its placement. (This is different from the current methods that treat the given meshes as fixed.) Under the chosen representation, with the L2 metric, the action of the re-parametrization group is by isometries. This results in, to our knowledge, the first Riemannian distance between parameterized surfaces to have all the desired invariances. We demonstrate this framework with several examples using some toy shapes, and real data with anatomical structures, and cropped facial surfaces. We also successfully demonstrate clustering and classification of these objects under the proposed metric.
  • Keywords
    computer graphics; computer vision; gradient methods; shape recognition; 3D objects; Riemannian framework; anatomical structures; computer vision; cropped facial surfaces; distance function; global scaling; gradient-based algorithm; image analysis; q-map; re-parametrization group; rigid motion; shape analysis; Anatomical structure; Computer displays; Humans; Image analysis; Mathematics; Optimization methods; Shape; Statistical analysis; Surface reconstruction; Surface treatment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition (CVPR), 2010 IEEE Conference on
  • Conference_Location
    San Francisco, CA
  • ISSN
    1063-6919
  • Print_ISBN
    978-1-4244-6984-0
  • Type

    conf

  • DOI
    10.1109/CVPR.2010.5539778
  • Filename
    5539778