DocumentCode
3401725
Title
Automatic calibration of a projector-camera system with a see-through screen
Author
Wei Hong ; Gelb, D. ; Trott, Mitchell
Author_Institution
HP Labs., Palo Alto, CA, USA
fYear
2012
fDate
Sept. 30 2012-Oct. 3 2012
Firstpage
337
Lastpage
340
Abstract
This paper proposes a method for automatic calibration of a projector-camera system with a see-through screen. Conventional projector-camera systems usually project a calibration pattern on an opaque screen for calibrating the system. Images captured by the camera contain only the calibration pattern. Recently, projector-camera systems with see-through screen have been developed for visual collaboration. Due to the semi-transparent property of the see-through screen, not only the calibration pattern, but also the background on the opposite side of the screen is captured by the camera. Since the calibration pattern is contaminated by the image of the background, conventional feature detection methods have difficulty in detecting the features of the calibration pattern and thus often fail to calibrate the system. In the proposed methods, the calibration pattern is temporally varied so that temporal correlation can be applied on a sequence of captured images to separate the calibration pattern from the background. This method works robustly and accurately even for backgrounds with high dynamic range and large motion. The entire calibration process is fully automatic and does not require any parameter tuning.
Keywords
calibration; cameras; image sequences; optical projectors; screens (display); automatic calibration method; calibration pattern; feature detection method; image contamination; image sequence; opaque screen; parameter tuning; projector-camera system; screen semi-transparent property; see-through screen; visual collaboration; Calibration; Cameras; Collaboration; Correlation; Feature extraction; Robustness; Transforms; See-through screen; calibration; projector-camera system;
fLanguage
English
Publisher
ieee
Conference_Titel
Image Processing (ICIP), 2012 19th IEEE International Conference on
Conference_Location
Orlando, FL
ISSN
1522-4880
Print_ISBN
978-1-4673-2534-9
Electronic_ISBN
1522-4880
Type
conf
DOI
10.1109/ICIP.2012.6466864
Filename
6466864
Link To Document