DocumentCode
340188
Title
Position of ion impact determined via detection of secondary electrons
Author
Shapira, D. ; Lewis, T.A.
Author_Institution
Div. of Phys., Oak Ridge Nat. Lab., TN, USA
Volume
2
fYear
1998
fDate
1998
Firstpage
811
Abstract
The factors affecting the performance of a position sensitive timing detector (PSTD), based on the detection of secondary electrons ejected from a foil by the passing ion, were investigated. We studied effects of multiple scattering in the foil, electron transport from foil to micro-channel plate detector (MCP) surface, and signal processing hardware. We conclude that, for detector with foil-to-MCP distance of 5-10 cm, electron transport limits the devices currently in use to resolution worse then 2 mm (fwhm)
Keywords
microchannel plates; position sensitive particle detectors; secondary electron emission; electron transport; ion impact position determination; micro-channel plate detector; multiple scattering; position sensitive timing detector; secondary electrons detection; signal processing hardware; Acceleration; Anodes; Electrons; Hardware; Particle scattering; Physics; Position sensitive particle detectors; Signal processing; Signal resolution; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium, 1998. Conference Record. 1998 IEEE
Conference_Location
Toronto, Ont.
ISSN
1082-3654
Print_ISBN
0-7803-5021-9
Type
conf
DOI
10.1109/NSSMIC.1998.774296
Filename
774296
Link To Document