DocumentCode
3401920
Title
Wireline and wireless RF-Interconnect for next generation SoC systems
Author
Sai-Wang Tam ; Chang, M.F. ; Jongsun Kim
Author_Institution
TagArray, Inc., Palo Alto, CA, USA
fYear
2011
fDate
7-10 Aug. 2011
Firstpage
1
Lastpage
3
Abstract
In the era of the nanometer CMOS technology, due to stringent system requirements in power, performance and other fundamental physical limitations (such as mechanical reliability, thermal constraints, overall system form factor, etc.), future SoC systems are relying more on ultra-high data rate scalable, re-configurable, highly compact and reliable interconnect fabric. To overcome such challenges, we explore the use of multiband wireline and wireless RF-Interconnect (RF-I) which can communicate simultaneously through multiple frequency bands with low power signal transmission, reconfigurable bandwidth and excellent mechanical flexibility and reliability.
Keywords
CMOS integrated circuits; integrated circuit interconnections; integrated circuit reliability; network-on-chip; SoC; low power signal transmission; mechanical flexibility; mechanical reliability; multiband wireline; nanometer CMOS technology; reconfigurable bandwidth; thermal constraints; wireless RF-interconnect; wireline RF-interconnect; CMOS integrated circuits; Hip; Metals; Optical buffering; Optical interconnections; Radio frequency; Wireless communication;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems (MWSCAS), 2011 IEEE 54th International Midwest Symposium on
Conference_Location
Seoul
ISSN
1548-3746
Print_ISBN
978-1-61284-856-3
Electronic_ISBN
1548-3746
Type
conf
DOI
10.1109/MWSCAS.2011.6026279
Filename
6026279
Link To Document