• DocumentCode
    3401995
  • Title

    Towards a unified framework for pre-silicon validation

  • Author

    Kannavara, Raghudeep

  • Author_Institution
    Intel Corp., Hillsboro, OR, USA
  • fYear
    2013
  • fDate
    10-12 July 2013
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    One of the major problems seen in the pre-silicon validation realm today is the lack of a unified framework for all pre-silicon validation efforts including security validation. Lack of a unified framework for pre-silicon validation presents a “communication” challenge among different validation tool teams. While each team maintains and enhances a particular tool depending on the project they support and while these projects shift geographies to keep up with the product development life cycle, keeping the tools up to date, addressing specific tool changes and communicating the tool changes among project teams and dependent tool teams is emaciating. With this perspective, this paper seeks to highlight this issue and present a high-level solution space to address this problem. Further, the paper highlights outstanding issues that need to be resolved to enable such a unified pre-silicon validation framework to be successful.
  • Keywords
    electronic design automation; formal verification; integrated circuit design; dependent tool teams; electronic design automation; high-level solution space; presilicon validation tool teams; product development life cycle; project teams; security validation; unified presilicon validation framework; Emulation; Formal verification; Hardware; Security; Silicon; Synchronization; Unified modeling language; computer aided design; electronic design automation; framework; pre-silicon validation; security validation; simulators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information, Intelligence, Systems and Applications (IISA), 2013 Fourth International Conference on
  • Conference_Location
    Piraeus
  • Print_ISBN
    978-1-4799-0770-0
  • Type

    conf

  • DOI
    10.1109/IISA.2013.6623735
  • Filename
    6623735