• DocumentCode
    3402032
  • Title

    An efficient trimming algorithm for A/D converters

  • Author

    Pei, Shiyan ; Khouzam, Nash ; Chan, Shu-Park

  • Author_Institution
    National Semiconductor Corp., Santa Clara, CA, USA
  • fYear
    1991
  • fDate
    14-17 May 1991
  • Firstpage
    391
  • Abstract
    An efficient trimming algorithm is developed for analog-to-digital converters in a production environment. The proposed algorithm fully utilizes the information obtained from the measurements in the trimming process and has much better performance than the trimming algorithms based on the popular binary search or linear search. It is shown that the new searching algorithm can improve the searching efficiency by over 93% over the traditional linear search in the worst-case comparison, and by over 70% on the average. Furthermore, the new approach has a decisive advantage over the binary search method because the linearity measurements have inherent noise contents. The proposed algorithm has been implemented in a production environment and has achieved the desired efficiency
  • Keywords
    analogue-digital conversion; integrated circuit testing; production testing; A/D converters; inherent noise contents; linearity measurements; production environment; searching algorithm; searching efficiency; trimming algorithm; Analog-digital conversion; Circuits and systems; Error correction; Laser theory; Laser transitions; Linearity; Production; Time measurement; Uncertainty; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1991., Proceedings of the 34th Midwest Symposium on
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    0-7803-0620-1
  • Type

    conf

  • DOI
    10.1109/MWSCAS.1991.252179
  • Filename
    252179