DocumentCode
3402122
Title
Modeling, scheduling, and dispatching in the dynamic environment of semiconductor manufacturing at FASL, Japan
Author
Pickett, Brian ; Zuniga, Miguel
Author_Institution
Adv. Micro Devices Inc., Austin, TX, USA
fYear
1997
fDate
10-12 Sep 1997
Firstpage
448
Lastpage
450
Abstract
At Fujitsu AMD Semiconductor Limited (FASL), the original scheduling and dispatching process was time consuming and inadequate to understand the effects on equipment utilization and cycle times caused by sudden changes in product mix or volume. The re-prioritizing of products due to dynamic changes in equipment status was difficult to achieve. As with any semiconductor manufacturing facility, the flow of materials through the factory was nonlinear. This meant that linear mathematical models could not predict the behavior of the flow accurately, and that initial metrics of the factory were not sufficient to predict status in the future. Furthermore, stochastic components inherent to process flows, such as equipment failures, yields, dynamic queues and reentrant flow compounded complexity. Consequently, FASL implemented MS/X OnTime from TYECIN Systems because of its modeling, scheduling, and dispatching capabilities. To update the simulation-based scheduler with actual WIP and equipment status, the scheduler was interfaced to the MES. The coupled systems provided an almost real-time dispatching capability. As a result of implementation, planners were able to model, schedule, and dispatch all products with 95% accuracy, generate dispatch lists by operator, and perform what-if analyses of changing factory conditions. Manual operations were also reduced to a minimum
Keywords
computer aided production planning; digital simulation; dispatching; electronic engineering computing; factory automation; integrated circuit manufacture; modelling; production control; FASL; Fujitsu AMD Semiconductor Limited; MES; MS/X OnTime; ManSim/X; TYECIN Systems; WIP and equipment status; cycle times; dispatching; dynamic environment; equipment status; equipment utilization; factory conditions; modeling; scheduling; semiconductor manufacturing facility; simulation-based scheduler; what-if analyses; Dispatching; Dynamic scheduling; Equipment failure; Job shop scheduling; Mathematical model; Performance analysis; Production facilities; Real time systems; Semiconductor materials; Stochastic processes;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Semiconductor Manufacturing Conference and Workshop, 1997. IEEE/SEMI
Conference_Location
Cambridge, MA
ISSN
1078-8743
Print_ISBN
0-7803-4050-7
Type
conf
DOI
10.1109/ASMC.1997.630779
Filename
630779
Link To Document