Title :
Model of the crystal of microcircuits for research of strained current and thermal modes
Author :
Gribskiy, M.P. ; Grygoriev, V. Ye ; Starostenko, V.V. ; Taran, Ye.P. ; Unzhakov, D.A.
Author_Institution :
Taurida Nat. Univ. V. I. Vernadsky, Simferopol
Abstract :
Electrothermal model of a crystal of the modern microcircuits is presented, considering many-layer of metallizing process, discharge circuits are considered at influence on microcircuits of pulse electromagnetic fields, threshold values of firmness of microcircuits are calculated.
Keywords :
crystals; dielectric materials; discharges (electric); integrated circuits; dielectrics; discharge circuits; electrothermal model; metallizing process; microcircuit crystal; microcircuits; strained current; thermal modes; Crystal microstructure; Electric breakdown; Electrothermal effects; Helium; IEEE catalog; Microwave technology; Organizing;
Conference_Titel :
Microwave & Telecommunication Technology, 2008. CriMiCo 2008. 2008 18th International Crimean Conference
Conference_Location :
Sevastopol, Crimea
Print_ISBN :
978-966-335-166-7
Electronic_ISBN :
978-966-335-169-8
DOI :
10.1109/CRMICO.2008.4676554
