Title :
Characterization of a multiplexed Compton scatter tomograph for non-destructive inspection of thin, low-Z samples
Author :
Evans, B.L. ; Martin, J.B. ; Burggraf, L.W.
Author_Institution :
Inst. of Technol., Wright-Patterson AFB, OH, USA
Abstract :
A demonstration multiplexed Compton scatter tomograph (MCST) has been built to assess the feasibility of performing single-sided, nondestructive inspection of thin, low-Z structures such as aluminum aircraft skin
Keywords :
Compton effect; X-ray imaging; inspection; nondestructive testing; tomography; Al; aircraft skin; multiplexed Compton scatter tomograph; nondestructive inspection; single-sided inspection; thin low-Z samples; Aircraft; Aluminum; Corrosion; Electromagnetic scattering; Gamma ray detection; Gamma ray detectors; Image reconstruction; Inspection; Particle scattering; Skin;
Conference_Titel :
Nuclear Science Symposium, 1998. Conference Record. 1998 IEEE
Conference_Location :
Toronto, Ont.
Print_ISBN :
0-7803-5021-9
DOI :
10.1109/NSSMIC.1998.774335
