• DocumentCode
    3402302
  • Title

    Resonator Q-factor measurement under conditions of mode degeneration removal

  • Author

    Glamazdin, V.V. ; Skresanov, V.N.

  • Author_Institution
    Usikov Inst. of Radio Phys. & Electron., Nat. Acad. of Sci. of Ukraine, Kharkiv
  • fYear
    2008
  • fDate
    8-12 Sept. 2008
  • Firstpage
    690
  • Lastpage
    691
  • Abstract
    A simple approach that allows determining the loaded quality factor of microwave resonators under conditions of the resonance line splitting corresponding to two-fold degenerative mode has been proposed. This technique, for example, solves the problem of superconductor surface resistance measurements using sapphire two-fold degenerative whispering gallery mode resonators.
  • Keywords
    Q-factor; microwave devices; resonators; whispering gallery modes; microwave resonators; quality factor; resonance line splitting; sapphire two-fold degenerative whispering gallery mode resonators; superconductor surface resistance; Positron emission tomography; Q factor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave & Telecommunication Technology, 2008. CriMiCo 2008. 2008 18th International Crimean Conference
  • Conference_Location
    Sevastopol, Crimea
  • Print_ISBN
    978-966-335-166-7
  • Electronic_ISBN
    978-966-335-169-8
  • Type

    conf

  • DOI
    10.1109/CRMICO.2008.4676558
  • Filename
    4676558
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3402302