• DocumentCode
    340234
  • Title

    High resolution X-ray imaging using amorphous silicon flat-panel arrays

  • Author

    Rahn, J.T. ; Lemmi, F. ; Lu, J.P. ; Mei, P. ; Apte, R.B. ; Street, R.A. ; Lujan, R. ; Weisfield, R.L. ; Heanue, J.A.

  • Author_Institution
    Xerox Palo Alto Res. Center, CA, USA
  • Volume
    2
  • fYear
    1998
  • fDate
    1998
  • Firstpage
    1073
  • Abstract
    Two dimensional amorphous silicon arrays are the emerging technology for digital medical X-ray imaging. This paper demonstrates an improved pixel design compared with the current generation of imagers. The geometry of the pixel sensor has been extended from a mesa isolated structure into a continuous layer above the readout structures of the array. This approach improves sensitivity to visible light and X-ray illumination when coupled with a conversion phosphor. Furthermore, this 3-dimensional geometry allows for the fabrication of the finest pitch amorphous silicon array yet manufactured, with a pixel size of 64 μm square. A test array (512×640 pixels) has been fabricated and tested which demonstrates the success of this approach
  • Keywords
    amorphous semiconductors; diagnostic radiography; silicon radiation detectors; Si; amorphous silicon flat-panel arrays; conversion phosphor; digital medical X-ray imaging; high resolution X-ray imaging; mesa isolated structure; pixel design; pixel sensor; readout structures; Amorphous silicon; Biomedical imaging; Geometry; Image generation; Image resolution; Isolation technology; Pixel; Sensor arrays; Testing; X-ray imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium, 1998. Conference Record. 1998 IEEE
  • Conference_Location
    Toronto, Ont.
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-5021-9
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1998.774350
  • Filename
    774350