Title :
Hemispherical spatial sampling study and 3D image reconstruction using iterative algorithms for a Compton SPECT camera model
Author :
Sauve, Anne C. ; Hero, Alfred O. ; Rogers, W. Leslie ; Clinthorne, Neal H.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
Abstract :
In this paper we will present numerical studies of the performance of a 3D Compton camera being developed at the University of Michigan. We present a physical model of the camera which exploits symmetries by using an adapted spatial sampling pattern in the object domain. This model increases the sparsity of the transition matrix to reduce the very high storage and computation requirements. This model also allows the decomposition of the transition matrix into several small blocks that are easy to store. We also present the transition matrix of our system analytically computed with a real time algorithm. We geometrically optimize our hemispherical sampling and develop a 3D volumetric interpolation. Finally, we present a 3D image reconstruction method which uses the Gauss-Seidel algorithm to minimize a penalized least square objective
Keywords :
Compton effect; image reconstruction; interpolation; iterative methods; least squares approximations; matrix decomposition; medical image processing; single photon emission computed tomography; sparse matrices; 3D Compton camera; 3D image reconstruction; 3D volumetric interpolation; Gauss-Seidel algorithm; SPECT camera model; adapted spatial sampling pattern; hemispherical spatial sampling; iterative algorithms; object domain; penalized least square objective; physical model; real time algorithm; rebinning; reduced computation requirements; small blocks; transition matrix decomposition; transition matrix sparsity; Cameras; Coordinate measuring machines; Detectors; Event detection; Image reconstruction; Image sampling; Interpolation; Iterative algorithms; Object detection; Sampling methods;
Conference_Titel :
Nuclear Science Symposium, 1998. Conference Record. 1998 IEEE
Conference_Location :
Toronto, Ont.
Print_ISBN :
0-7803-5021-9
DOI :
10.1109/NSSMIC.1998.774365