Title :
On the possibilities of automatic measurements of microwave parameters of MMIC on wafer in Istok
Author :
Galdetskiy, A.V. ; Buvailyk, E.V. ; Vasiliev, V.I. ; Korolev, A.N.
Author_Institution :
FSUE Istok, Fryazino
Abstract :
Some possibilities of the measuring of microwave characteristics of MMICpsilas and transistors on wafer are presented. The developed software gives opportunities to realize complicated scripts of measurements and testing.
Keywords :
MMIC; microwave measurement; microwave transistors; Istok; MMIC; automatic measurements; microwave parameters; transistors; wafer; Helium; Histograms; IEEE catalog; MMICs; Microwave measurements; Microwave technology; Microwave transistors; Organizing; Software measurement; Software testing;
Conference_Titel :
Microwave & Telecommunication Technology, 2008. CriMiCo 2008. 2008 18th International Crimean Conference
Conference_Location :
Sevastopol, Crimea
Print_ISBN :
978-966-335-166-7
Electronic_ISBN :
978-966-335-169-8
DOI :
10.1109/CRMICO.2008.4676571
