Title :
High-quality depth map up-sampling robust to edge noise of range sensors
Author :
Daeyoung Kim ; Kuk-Jin Yoon
Author_Institution :
Gwangju Inst. of Sci. & Technol. (GIST), Gwangju, South Korea
fDate :
Sept. 30 2012-Oct. 3 2012
Abstract :
A new method to up-sample low-resolution depth maps to high quality and high resolution is proposed. Range sensors such as time-of-flight cameras yield low-resolution depth maps and the output includes heavy noise at the edges of objects. Recently, many techniques have been proposed to up-sample low-resolution depth maps. However, there is no effective countermeasure to the edge noise problem. The proposed up-sampling method is based on Markov random fields and addresses this edge noise using newly designed confidence weights. The performance of our method is evaluated using error rate and mean absolute error through comparison with existing methods, and results show that the proposed method outperforms conventional methods.
Keywords :
Markov processes; computer vision; image resolution; image sampling; Markov random field; edge noise; error rate; high-quality depth map up-sampling; low-resolution depth maps; mean absolute error; range sensor; time-of-flight camera; Coherence; Image color analysis; Image edge detection; Image resolution; Image segmentation; Noise; Sensors; KINECT; MRFs; ToF; depth; up-sampling;
Conference_Titel :
Image Processing (ICIP), 2012 19th IEEE International Conference on
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4673-2534-9
Electronic_ISBN :
1522-4880
DOI :
10.1109/ICIP.2012.6466919