• DocumentCode
    3402745
  • Title

    Automated visual inspection using syntactic representation

  • Author

    Hennessey, Kathleen ; Hahn, Kwang-Soo ; Lin, YouLing

  • Author_Institution
    Inst. for Studies of Organ. Autom., Texas Tech. Univ., Lubbock, TX, USA
  • fYear
    1991
  • fDate
    14-17 May 1991
  • Firstpage
    146
  • Abstract
    A knowledge-based automated visual inspection system is described which operates in two modes: learning and production. In the learning mode either a CAD (computer-aided design) file of the components or a standard reference image is converted to an implicit grammar. The grammar, which is a syntactical description of the reference image, is stored in the knowledge base. For the production mode, grammar rules about the inspection of the image are converted to a parse table. The image to be inspected is captured and digitized. Only the small area of the image in which the next image segments are expected is enhanced, achieving considerable savings in processing time. The general-purpose (predictive) parser analyzes the image, reporting component names, locations, the component identification, and possible defects due to syntactic or semantic errors. Finally, a knowledge-based system characterizes the defects. The operation of the current system is described, and implementation considerations are presented
  • Keywords
    VLSI; automatic optical inspection; computer vision; integrated circuit testing; knowledge based systems; production testing; component identification; implementation considerations; implicit grammar; knowledge base; knowledge-based automated visual inspection system; knowledge-based system; learning mode; modes; operation; parse table; production mode; savings in processing time; standard reference image; syntactic representation; Assembly; Automatic testing; Feature extraction; Geometry; Humans; Image analysis; Image sequence analysis; Inspection; Manufacturing automation; Microscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1991., Proceedings of the 34th Midwest Symposium on
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    0-7803-0620-1
  • Type

    conf

  • DOI
    10.1109/MWSCAS.1991.252214
  • Filename
    252214