• DocumentCode
    3402757
  • Title

    Multi-threshold transistors cell for Low Voltage temperature sensing applications

  • Author

    Sheng-Huang Lee ; Chen Zhao ; Yen-Ting Wang ; Degang Chen ; Geiger, Richard

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA
  • fYear
    2011
  • fDate
    7-10 Aug. 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A new Low Voltage CMOS temperature sensor with low supply sensitivity is introduced. Though operation over a large temperature range is possible, this structure is particularly useful in power/thermal management applications where a rather narrow temperature band is of most concern. The sensor is based upon a multi-threshold 4 transistors cell and uses the temperature dependence of the threshold voltages to sense temperature. The low headroom requirement of the structure allows for very low voltage operation or practical cascoding at nominal supply voltages to further reduce the supply voltage sensitivity. With proper device sizing, a very linear relationship between output voltage and temperature is achieved. Simulation results show that the temperature linearity is robustness to process variations and the cascoded implementation has excellent insensitivity to the power supply voltage. The circuit has been implemented in a 65nm digital process with multiple threshold voltages devices. Simulation results show a temperature nonlinearity of less than 0.5°C over the temperature range of 100~150°C.
  • Keywords
    CMOS integrated circuits; low-power electronics; temperature sensors; thermal management (packaging); transistors; digital process; headroom requirement; low supply sensitivity; low voltage CMOS temperature sensor; multithreshold transistors cell; power supply voltage; power-thermal management application; size 65 nm; temperature 100 degC to 150 degC; Monitoring; Robustness; Temperature dependence; Temperature measurement; Temperature sensors; Thermal management;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (MWSCAS), 2011 IEEE 54th International Midwest Symposium on
  • Conference_Location
    Seoul
  • ISSN
    1548-3746
  • Print_ISBN
    978-1-61284-856-3
  • Electronic_ISBN
    1548-3746
  • Type

    conf

  • DOI
    10.1109/MWSCAS.2011.6026321
  • Filename
    6026321