DocumentCode :
3402770
Title :
Minimum detectable capacitance in capacitive readout circuits
Author :
Seraji, N.E. ; Yavari, Mohammad
Author_Institution :
Dept. of Electr. Eng., Amirkabir Univ. of Technol., Tehran, Iran
fYear :
2011
fDate :
7-10 Aug. 2011
Firstpage :
1
Lastpage :
4
Abstract :
In this paper, accurate equations are presented to calculate the capacitance resolution in the readout circuits exploiting different techniques to reduce the circuit low-frequency noise. The circuit parameters and trade-offs affecting the capacitance resolution are comprehensively involved in these equations. Transistor level simulations are performed with a 0.18 μm CMOS technology using Spectre RF to verify the obtained equations. The results of comparing two utilized common techniques, so called correlated double sampling (CDS) and chopper stabilization (CHS), reveal that employing the combination of these techniques results in the minimum resolution variation as the input parasitic capacitance is changed.
Keywords :
CMOS integrated circuits; capacitive sensors; choppers (circuits); readout electronics; transistors; CDS; CHS; CMOS technology; capacitance detector; chopper stabilization; circuit low-frequency noise; correlated double sampling; parasitic capacitance; size 0.18 mum; spectre RF; transistor level simulations; Capacitance; Integrated circuits; Noise; Radio frequency; Simulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (MWSCAS), 2011 IEEE 54th International Midwest Symposium on
Conference_Location :
Seoul
ISSN :
1548-3746
Print_ISBN :
978-1-61284-856-3
Electronic_ISBN :
1548-3746
Type :
conf
DOI :
10.1109/MWSCAS.2011.6026322
Filename :
6026322
Link To Document :
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