• DocumentCode
    3402787
  • Title

    Fast directional chamfer matching

  • Author

    Liu, Ming-Yu ; Tuzel, Oncel ; Veeraraghavan, Ashok ; Chellappa, Rama

  • Author_Institution
    Univ. of Maryland, College Park, MD, USA
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    1696
  • Lastpage
    1703
  • Abstract
    We study the object localization problem in images given a single hand-drawn example or a gallery of shapes as the object model. Although many shape matching algorithms have been proposed for the problem over the decades, chamfer matching remains to be the preferred method when speed and robustness are considered. In this paper, we significantly improve the accuracy of chamfer matching while reducing the computational time from linear to sublinear (shown empirically). Specifically, we incorporate edge orientation information in the matching algorithm such that the resulting cost function is piecewise smooth and the cost variation is tightly bounded. Moreover, we present a sublinear time algorithm for exact computation of the directional chamfer matching score using techniques from 3D distance transforms and directional integral images. In addition, the smooth cost function allows to bound the cost distribution of large neighborhoods and skip the bad hypotheses within. Experiments show that the proposed approach improves the speed of the original chamfer matching upto an order of 45×, and it is much faster than many state of art techniques while the accuracy is comparable.
  • Keywords
    edge detection; image matching; transforms; 3D distance transforms; computational time; cost distribution; cost variation; directional chamfer matching score; directional integral images; edge orientation information; fast directional chamfer matching; gallery of shapes; object localization problem; object model; piecewise smooth; shape matching algorithms; single hand-drawn example; smooth cost function; sublinear time algorithm; Art; Cost function; Educational institutions; Humans; Image recognition; Image segmentation; Object recognition; Robustness; Shape measurement; Velocity measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition (CVPR), 2010 IEEE Conference on
  • Conference_Location
    San Francisco, CA
  • ISSN
    1063-6919
  • Print_ISBN
    978-1-4244-6984-0
  • Type

    conf

  • DOI
    10.1109/CVPR.2010.5539837
  • Filename
    5539837