DocumentCode
3402787
Title
Fast directional chamfer matching
Author
Liu, Ming-Yu ; Tuzel, Oncel ; Veeraraghavan, Ashok ; Chellappa, Rama
Author_Institution
Univ. of Maryland, College Park, MD, USA
fYear
2010
fDate
13-18 June 2010
Firstpage
1696
Lastpage
1703
Abstract
We study the object localization problem in images given a single hand-drawn example or a gallery of shapes as the object model. Although many shape matching algorithms have been proposed for the problem over the decades, chamfer matching remains to be the preferred method when speed and robustness are considered. In this paper, we significantly improve the accuracy of chamfer matching while reducing the computational time from linear to sublinear (shown empirically). Specifically, we incorporate edge orientation information in the matching algorithm such that the resulting cost function is piecewise smooth and the cost variation is tightly bounded. Moreover, we present a sublinear time algorithm for exact computation of the directional chamfer matching score using techniques from 3D distance transforms and directional integral images. In addition, the smooth cost function allows to bound the cost distribution of large neighborhoods and skip the bad hypotheses within. Experiments show that the proposed approach improves the speed of the original chamfer matching upto an order of 45×, and it is much faster than many state of art techniques while the accuracy is comparable.
Keywords
edge detection; image matching; transforms; 3D distance transforms; computational time; cost distribution; cost variation; directional chamfer matching score; directional integral images; edge orientation information; fast directional chamfer matching; gallery of shapes; object localization problem; object model; piecewise smooth; shape matching algorithms; single hand-drawn example; smooth cost function; sublinear time algorithm; Art; Cost function; Educational institutions; Humans; Image recognition; Image segmentation; Object recognition; Robustness; Shape measurement; Velocity measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision and Pattern Recognition (CVPR), 2010 IEEE Conference on
Conference_Location
San Francisco, CA
ISSN
1063-6919
Print_ISBN
978-1-4244-6984-0
Type
conf
DOI
10.1109/CVPR.2010.5539837
Filename
5539837
Link To Document