DocumentCode :
3402821
Title :
Measurement of UHF-permittivity of liquid crystals in porous silicon
Author :
Drokin, N.A. ; Timashov, V.A. ; Uzova, V.A.
Author_Institution :
L.V. Kirensky Inst. of Phys., Krasnoyarsk
fYear :
2008
fDate :
8-12 Sept. 2008
Firstpage :
745
Lastpage :
746
Abstract :
Method of dielectric investigation of liquid crystals (LQ) confined into porous silicon (PSi) is described. Individuality technique for dielectric measurements consists oa using two type sensors, switching as a system elements in the microstrip resonance contour. The effective permittivity and molecular alignments of PSi with LQ (8CB) is determined in frequency range 103 - 5 times 108 MHz.
Keywords :
elemental semiconductors; liquid crystals; microwave materials; molecular orientation; permittivity; porosity; porous materials; silicon; Si; UHF-permittivity; dielectric measurements; frequency 10000 MHz to 500000000 MHz; liquid crystals; microstrip resonance contour; molecular alignments; porous silicon; sensors; Flowcharts; Hafnium; Liquid crystals; Microstrip; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave & Telecommunication Technology, 2008. CriMiCo 2008. 2008 18th International Crimean Conference
Conference_Location :
Sevastopol, Crimea
Print_ISBN :
978-966-335-166-7
Electronic_ISBN :
978-966-335-169-8
Type :
conf
DOI :
10.1109/CRMICO.2008.4676583
Filename :
4676583
Link To Document :
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