• DocumentCode
    340286
  • Title

    Effect of an imaginary combination coefficient on the global image variance in SPECT

  • Author

    Pan, Xiaochuan

  • Author_Institution
    Dept. of Radiol., Chicago Univ., IL, USA
  • Volume
    2
  • fYear
    1998
  • fDate
    1998
  • Firstpage
    1392
  • Abstract
    Image reconstruction in SPECT with uniform attenuation is theoretically appealing as well as practically important. In this work, we investigated a class of reconstruction algorithms that are indexed by a complex combination coefficient. The class with a real combination coefficient proposed previously can be interpreted as a subclass of this new class. We studied theoretically and evaluated numerically the impact of the introduction of such a complex combination coefficient on the variances in reconstructed images. Specifically, we investigated theoretically as well as quantitatively whether and to what extent the introduction of a complex combination coefficient can further reduce the variances in SPECT images. Using the Shepp-Logan phantom, we evaluate quantitatively the difference of image variances obtained with the quasi-optimal algorithm that we proposed previously and the true optimal algorithm that is generally unobtainable without prior knowledge of the object
  • Keywords
    Radon transforms; image reconstruction; medical image processing; single photon emission computed tomography; Radon transform; SPECT; Shepp-Logan phantom; complex combination coefficient; global image variance; ideal sinogram; image reconstruction; imaginary combination coefficient; linear estimation; modified sinogram; quasi-optimal algorithm; reconstruction algorithms; true optimal algorithm; uniform attenuation; Attenuation; Computed tomography; Fourier transforms; Image reconstruction; Imaging phantoms; Nuclear medicine; Radiology; Reconstruction algorithms; Scattering; Stochastic processes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium, 1998. Conference Record. 1998 IEEE
  • Conference_Location
    Toronto, Ont.
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-5021-9
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1998.774412
  • Filename
    774412