DocumentCode
3402860
Title
Image deconvolution for enhancing IR images in order to detect defects in metallic plates
Author
Qidwai, Uvais ; Maqbool, Mohammed
Author_Institution
Comput. Sci. & Eng. Dept., Qatar Univ., Doha, Qatar
fYear
2009
fDate
14-17 Dec. 2009
Firstpage
230
Lastpage
235
Abstract
In this paper, infrared (IR) imaging technique is used in conjunction with image deconvolution algorithms in order to enhance detection capabilities of the NDT personnel in detecting defects such as cracks, voids, and pitting. The main idea utilized here is the fact that the heat distribution remains fairly homogenous in a healthy metal and can be seen as a flat surface under IR imaging camera. However, things change drastically if there is a discontinuity in the homogenous metal, such as defects. This change is exploited in this work as an output of a defect function which produces this output when healthy metal image is given as an input to it. H¿ deconvolution methodology has been utilized here to isolate (deconvolve) the defect function and be able to regenerate the output image without any other obscuring elements. This can enhance the detection capability of the IR camera as well as the NDT personnel.
Keywords
deconvolution; image processing; infrared imaging; nondestructive testing; plates (structures); subroutines; surface cracks; voids (solid); IR images; cracks; defect detection; flat surface; heat distribution; image deconvolution; image deconvolution algorithms; infrared imaging technique; metallic plates; nondestructive testing; pitting; voids; Cameras; Deconvolution; Infrared detectors; Infrared imaging; Optical imaging; Optical surface waves; Personnel; Surface cracks; Surface morphology; Temperature sensors; Blind Deconvolution; Defect Detection‥; H∞ Deconvolution; IR images; Image Enhancement; Morphological Operations;
fLanguage
English
Publisher
ieee
Conference_Titel
Signal Processing and Information Technology (ISSPIT), 2009 IEEE International Symposium on
Conference_Location
Ajman
Print_ISBN
978-1-4244-5949-0
Type
conf
DOI
10.1109/ISSPIT.2009.5407573
Filename
5407573
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