Title :
Point process approaches to the modeling and analysis of self-similar traffic .I. Model construction
Author :
Ryu, Bong K. ; Lowen, Steven B.
Author_Institution :
Dept. of Electr. Eng., Columbia Univ., New York, NY, USA
Abstract :
We propose four fractal point processes (FPPs) as novel approaches to modeling and analyzing various types of self-similar traffic: the fractal renewal process (FRP), the superposition of several fractal renewal processes (Sup-FRP), the fractal-shot-noise-driven Poisson process (FSNDP), and the fractal-binomial-noise-driven Poisson process (FBNDP). These models fall into two classes depending on their construction. A study of these models provides a thorough understanding of how self-similarity arises in computer network traffic. We find that (i) all these models are (second-order) self-similar in nature; (ii) the Hurst parameter alone does not fully capture the burstiness of a typical self-similar process; (iii) the heavy-tailed property is not a necessary condition to yield self-similarity; and (iv) these models permit parsimonious modeling (using only 2-5 parameters) and fast simulation. Simulation verifies that these models exhibit a fractal behavior over a wide range of time scales
Keywords :
computer networks; fractals; shot noise; stochastic processes; telecommunication traffic; Hurst parameter; computer network traffic; fast simulation; fractal behavior; fractal binomial noise driven Poisson process; fractal point processes; fractal renewal process; fractal renewal processes superposition; fractal shot noise driven Poisson process; heavy-tailed property; modeling; second-order self-similar models; self-similar traffic; simulation; time scales; Computer networks; Ethernet networks; Fiber reinforced plastics; Fractals; High-speed networks; Quality of service; Statistics; Telecommunication traffic; Traffic control; Video compression;
Conference_Titel :
INFOCOM '96. Fifteenth Annual Joint Conference of the IEEE Computer Societies. Networking the Next Generation. Proceedings IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
0-8186-7293-5
DOI :
10.1109/INFCOM.1996.493096