Title :
Application of time reversal signal processing to microwave NDE
Author :
Reyes-Rodríguez, S. ; Lei, N. ; McGough, R.J. ; Udpa, S. ; Udpa, L.
Author_Institution :
Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI, USA
Abstract :
This paper presents a feasibility study of imaging defects in dielectric materials using principles of time reversal with microwaves. The principle is demonstrated using a two-dimensional finite difference time domain model for simulating the propagation of forward and time reversed wave fields. The scattered electric field is recorded on a linear array of receivers; time reversed and propagated backwards using the model to highlight the scatterer/defect. Simulations results validating the approach are presented. Initial results demonstrate the ability of the technique to image defects.
Keywords :
crystal defects; dielectric materials; finite difference time-domain analysis; nondestructive testing; signal processing; wave propagation; dielectric materials; imaging defects; time reversal signal processing; two-dimensional finite difference time domain model; wave propagation; Acoustic noise; Acoustic propagation; Equations; Finite difference methods; Magnetic materials; Microwave propagation; Noise shaping; Signal processing; Speckle; Titanium; Finite Difference Time Domain; Microwave; Time Reversal;
Conference_Titel :
Signal Processing and Information Technology (ISSPIT), 2009 IEEE International Symposium on
Conference_Location :
Ajman
Print_ISBN :
978-1-4244-5949-0
DOI :
10.1109/ISSPIT.2009.5407576