• DocumentCode
    3403800
  • Title

    Exploring the opportunity of optimizing sequencing elements in ASIC designs

  • Author

    Seungwhun Paik ; Jaeha Kung ; Youngsoo Shin

  • Author_Institution
    Dept. of Electr. Eng., KAIST, Daejeon, South Korea
  • fYear
    2011
  • fDate
    7-10 Aug. 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    An edge-triggered flip-flop is a de facto standard sequencing element in ASIC designs. As sequencing elements occupy increasing portion of timing and power, it is necessary to explore other types of elements. We identify pulsed-latch and dual edge-triggered flip-flop as two promising candidates. The challenges when they are employed for conventional ASIC design are identified, and potential solutions are addressed.
  • Keywords
    application specific integrated circuits; flip-flops; integrated circuit design; ASIC designs; dual-edge-triggered flip-flop; pulsed-latch flip-flop; sequencing element optimization; Flip-flops; Latches; Logic gates; Optimization; Robustness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (MWSCAS), 2011 IEEE 54th International Midwest Symposium on
  • Conference_Location
    Seoul
  • ISSN
    1548-3746
  • Print_ISBN
    978-1-61284-856-3
  • Electronic_ISBN
    1548-3746
  • Type

    conf

  • DOI
    10.1109/MWSCAS.2011.6026379
  • Filename
    6026379