DocumentCode :
3403819
Title :
Learning full pairwise affinities for spectral segmentation
Author :
Tae Hoon Kim ; Kyoung Mu Lee ; Sang Uk Lee
Author_Institution :
Dept. of EECS, Seoul Nat. Univ., Seoul, South Korea
fYear :
2010
fDate :
13-18 June 2010
Firstpage :
2101
Lastpage :
2108
Abstract :
This paper studies the problem of learning a full range of pairwise affinities gained by integrating local grouping cues for spectral segmentation. The overall quality of the spectral segmentation depends mainly on the pairwise pixel affinities. By employing a semi-supervised learning technique, optimal affinities are learnt from the test image without iteration. We first construct a multi-layer graph with pixels and regions, generated by the mean shift algorithm, as nodes. By applying the semi-supervised learning strategy to this graph, we can estimate the intra- and inter-layer affinities between all pairs of nodes together. These pair-wise affinities are then used to simultaneously cluster all pixel and region nodes into visually coherent groups across all layers in a single multi-layer framework of Normalized Cuts. Our algorithm provides high-quality segmentations with object details by directly incorporating the full range connections in the spectral framework. Since the full affinity matrix is defined by the inverse of a sparse matrix, its eigen-decomposition is efficiently computed. The experimental results on Berkeley and MSRC image databases demonstrate the relevance and accuracy of our algorithm as compared to existing popular methods.
Keywords :
image segmentation; learning (artificial intelligence); sparse matrices; multilayer graph; semisupervised learning technique; sparse matrix; spectral segmentation; Clustering algorithms; Computer vision; Humans; Image databases; Image segmentation; Partitioning algorithms; Pixel; Semisupervised learning; Sparse matrices; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition (CVPR), 2010 IEEE Conference on
Conference_Location :
San Francisco, CA
ISSN :
1063-6919
Print_ISBN :
978-1-4244-6984-0
Type :
conf
DOI :
10.1109/CVPR.2010.5539888
Filename :
5539888
Link To Document :
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