Title :
Selective silane removal: a technique for micropatterning of neurons in culture
Author :
Corey, Joseph M. ; Wheeler, Bruce C. ; Brewer, Gregory J.
Author_Institution :
Neurosci. Program, Illinois Univ., Urbana, IL, USA
Abstract :
The authors have developed a new photoresist based technique for micrometer resolution patterning of covalently bound silanes on glassy substrates in order to pattern the growth of primary hippocampal neurons in low density culture. The technique is named Selective Silane Removal because the substrate is initially reacted with a cytophilic aminosilane (trimethoxy-silylpropyl-diethylenetriamine or DETA), which, is then aggressively removed by plasma etching through a masking layer of patterned photoresist. The process is completed by reacting the cleaned surface areas with a cytophobic arylsilane (phenyltrichlorosilane or PTCS) followed by removal of the photoresist, rinsing and sterilization. Embryonic rat hippocampal neurons are cultured on the substrates at very low density (20000 cells/cm2) using serum free B27/Neurobasal(TM) defined medium. Up to 90% of cell bodies grown on these substrates complied to a grid pattern of 3, 5 or 10 μm wide lines. An average of 76% of the background squares were free of stray neurites or cells connected to the pattern
Keywords :
biological techniques; biotechnology; cellular biophysics; neurophysiology; photoresists; 3 to 10 mum; background squares; connected cells; covalently bound silanes; cytophilic aminosilane; glassy substrates; grid pattern; low density culture; micrometer resolution patterning; neurons micropatterning in culture; photoresist based technique; primary hippocampal neurons; selective silane removal; serum free B27/Neurobasal-defined medium; stray neurites; Biomedical engineering; Cells (biology); Circuits; Electrodes; Etching; Laser ablation; Neurons; Plasma applications; Resists; Surface topography;
Conference_Titel :
Engineering in Medicine and Biology Society, 1995., IEEE 17th Annual Conference
Conference_Location :
Montreal, Que.
Print_ISBN :
0-7803-2475-7
DOI :
10.1109/IEMBS.1995.579914