DocumentCode
3404252
Title
Research on the charge trap in polymer by optical and thermal methods
Author
He, Lijuan ; Li, Dawei ; Xie, Haiping ; Wang, Xuan ; Lei, Qingquan
fYear
2011
fDate
12-16 Oct. 2011
Firstpage
157
Lastpage
159
Abstract
The distribution of charge trap in polyethylene was studied by means of photo-stimulated discharge (PSD) and thermally stimulated discharge (TSD). The shallow trap of 0.77eV in the analysis of TSD comes from the same trap distribution as the deep trap of the depth from 4.80 to 5.90eV in PSD. The results showed that the trap itself is suffered from thermal erosion in the process of charge released by heat. PSD method is considered to be a more accurate method on investigating the trap levels in dielectrics.
Keywords
deep levels; dielectric materials; optical polymers; thermally stimulated currents; charge trap; deep trap; dielectric materials; optical methods; photostimulated discharge; polyethylene; shallow trap; thermal erosion; thermal methods; thermally stimulated discharge; trap levels; Contracts; Dielectrics; Discharges; Heating; Polymers; Space charge; PSD; TSD; charge trap; polymer;
fLanguage
English
Publisher
ieee
Conference_Titel
Optoelectronics and Microelectronics Technology (AISOMT), 2011 Academic International Symposium on
Conference_Location
Harbin
Print_ISBN
978-1-4577-0794-0
Type
conf
DOI
10.1109/AISMOT.2011.6159342
Filename
6159342
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