Title :
Use bin-ratio information for category and scene classification
Author :
Xie, Nianhua ; Ling, Haibin ; Hu, Weiming ; Zhang, Xiaoqin
Author_Institution :
Nat. Lab. of Pattern Recognition, CAS, Beijing, China
Abstract :
In this paper we propose using bin-ratio information, which is collected from the ratios between bin values of histograms, for scene and category classification. To use such information, a new histogram dissimilarity, bin-ratio dissimilarity (BRD), is designed. We show that BRD provides several attractive advantages for category and scene classification tasks: First, BRD is robust to cluttering, partial occlusion and histogram normalization; Second, BRD captures rich co-occurrence information while enjoying a linear computational complexity; Third, BRD can be easily combined with other dissimilarity measures, such as L1 and χ2, to gather complimentary information. We apply the proposed methods to category and scene classification tasks in the bag-of-words framework. The experiments are conducted on several widely tested datasets including PASCAL 2005, PASCAL 2008, Oxford flowers, and Scene-15 dataset. In all experiments, the proposed methods demonstrate excellent performance in comparison with previously reported solutions.
Keywords :
image classification; bag-of-words framework; bin value; bin-ratio dissimilarity; bin-ratio information; category classification; cooccurrence information; dissimilarity measures; histogram dissimilarity; histogram normalization; linear computational complexity; partial occlusion; scene classification; Automation; Computational complexity; Earth; Frequency; Histograms; Laboratories; Layout; Pattern recognition; Robustness; Testing;
Conference_Titel :
Computer Vision and Pattern Recognition (CVPR), 2010 IEEE Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4244-6984-0
DOI :
10.1109/CVPR.2010.5539917