• DocumentCode
    3404426
  • Title

    Global Gaussian approach for scene categorization using information geometry

  • Author

    Nakayama, Hideki ; Harada, Tatsuya ; Kuniyoshi, Yasuo

  • Author_Institution
    Grad. Sch. of Inf. Sci. & Technol., Univ. of Tokyo, Tokyo, Japan
  • fYear
    2010
  • fDate
    13-18 June 2010
  • Firstpage
    2336
  • Lastpage
    2343
  • Abstract
    Local features provide powerful cues for generic image recognition. An image is represented by a “bag” of local features, which form a probabilistic distribution in the feature space. The problem is how to exploit the distributions efficiently. One of the most successful approaches is the bag-of-keypoints scheme, which can be interpreted as sparse sampling of high-level statistics, in the sense that it describes a complex structure of a local feature distribution using a relatively small number of parameters. In this paper, we propose the opposite approach, dense sampling of low-level statistics. A distribution is represented by a Gaussian in the entire feature space. We define some similarity measures of the distributions based on an information geometry framework and show how this conceptually simple approach can provide a satisfactory performance, comparable to the bag-of-keypoints for scene classification tasks. Furthermore, because our method and bag-of-keypoints illustrate different statistical points, we can further improve classification performance by using both of them in kernels.
  • Keywords
    Gaussian processes; computational geometry; feature extraction; image classification; image recognition; feature distribution; global Gaussian approach; image recognition; information geometry; probabilistic distribution; scene categorization; Image recognition; Image sampling; Information geometry; Information science; Kernel; Layout; Linear approximation; Solids; Space technology; Statistical distributions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition (CVPR), 2010 IEEE Conference on
  • Conference_Location
    San Francisco, CA
  • ISSN
    1063-6919
  • Print_ISBN
    978-1-4244-6984-0
  • Type

    conf

  • DOI
    10.1109/CVPR.2010.5539921
  • Filename
    5539921