Title :
Compressive sampling with unknown blurring function: Application to passive millimeter-wave imaging
Author :
Amizic, Bruno ; Spinoulas, Leonidas ; Molina, Rafael ; Katsaggelos, Aggelos K.
Author_Institution :
Dept. of Electr. Eng. & Comp. Sc., Northwestern Univ., Evanston, IL, USA
fDate :
Sept. 30 2012-Oct. 3 2012
Abstract :
We propose a novel blind image deconvolution (BID) regularization framework for compressive passive millimeter-wave (PMMW) imaging systems. The proposed framework is based on the variable-splitting optimization technique, which allows us to utilize existing compressive sensing reconstruction algorithms in compressive BID problems. In addition, a non-convex lp quasi-norm with 0 <; p <; 1 is employed as a regularization term for the image, while a simultaneous auto-regressive (SAR) regularization term is utilized for the blur. Furthermore, the proposed framework is very general and it can be easily adapted to other state-of-the-art BID approaches that utilize different image/blur regularization terms. Experimental results, obtained with simulations using a synthetic image and real PMMW images, show the advantage of the proposed approach compared to existing ones.
Keywords :
autoregressive processes; compressed sensing; deconvolution; image restoration; millimetre wave imaging; optimisation; BID regularization framework; PMMW imaging systems; SAR regularization term; blind image deconvolution regularization framework; compressive BID problems; compressive passive millimeter-wave imaging systems; compressive sampling; image regularization term; image-blur regularization terms; nonconvex quasinorm; real PMMW images; simultaneous autoregressive regularization term; synthetic image; unknown blurring function; variable-splitting optimization technique; Compressed sensing; Image coding; Image restoration; Imaging; Millimeter wave technology; Optimization; Vectors; Variable-splitting; blind image deconvolution; compressive sensing; inverse methods;
Conference_Titel :
Image Processing (ICIP), 2012 19th IEEE International Conference on
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4673-2534-9
Electronic_ISBN :
1522-4880
DOI :
10.1109/ICIP.2012.6467012