Calculation and analysis of Hu moment of Continuous-Wave Terahertz reflecting image

Author

Li, Qi ; Li, Yun-Da ; Ding, Sheng-Hui ; Wang, Qi

Author_Institution

Nat. Key Lab. of Sci. & Technol. on Tunable laser, Harbin Inst. of Technol., Harbin, China

fYear

2011

fDate

12-16 Oct. 2011

Firstpage

204

Lastpage

207

Abstract

Terahertz (THz) radiation can penetrate nonmetallic materials and nonpolar materials, and has low photon energy, therefore THz imaging has drawn more attention. The moment function of an image has wide applications on pattern recognition and target classification. The paper has applied image segmentation to Continuous-Wave THz point-to-point scanning reflecting image depending on Otsu´s method. The Hu moments of the original image and the segmentation image were calculated, and the mean value and relative error were also obtained. It can provide technical support for THz image pattern recognition by use of moment invariants.

Keywords

image segmentation; light reflection; microwave photonics; pattern recognition; terahertz wave imaging; Hu moment analysis; Otsu method; THz imaging; continuous-wave terahertz point-to-point scanning reflecting image; image pattern recognition; image segmentation; mean value; moment function; moment invariants; nonmetallic materials; nonpolar materials; photon energy; relative error; target classification; terahertz radiation; Image segmentation; Imaging; Materials; Optimized production technology; Pattern recognition; Photonics; Shape; Hu moment; Terahertz; continuous; reflecting imaging;

fLanguage

English

Publisher

ieee

Conference_Titel

Optoelectronics and Microelectronics Technology (AISOMT), 2011 Academic International Symposium on

Conference_Location

Harbin

Print_ISBN

978-1-4577-0794-0

Type

conf

DOI

10.1109/AISMOT.2011.6159354

Filename

6159354