DocumentCode
3404558
Title
Application of and rating structure for ground and test devices used in metal-clad switchgear
Author
Bridger, Baldwin, Jr.
Author_Institution
Powell Electr. Manuf. Co., Houston, TX, USA
fYear
1988
fDate
2-7 Oct. 1988
Firstpage
1514
Abstract
Ground and test devices are accessories for use in grounding and testing the primary conductors in metal-clad switchgear. The author describes the types commonly available and their use. He notes that these devices are not covered by an existing standards and examines rating structures and test requirements that should apply to them. The creation of a standard to cover ground and test devices is proposed.<>
Keywords
earthing; switchgear; ground devices; grounding; metal-clad switchgear; primary conductors; rating structure; test devices; Conductors; Grounding; Switchgear; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Industry Applications Society Annual Meeting, 1988., Conference Record of the 1988 IEEE
Conference_Location
Pittsburgh, PA, USA
Type
conf
DOI
10.1109/IAS.1988.25258
Filename
25258
Link To Document