• DocumentCode
    3404648
  • Title

    A method of second harmonic measuring glass thickness with ultra-precision based on multi-beam laser heterodyne

  • Author

    Wang, Chun Hui ; Li, Yan Chao ; Gao, Long ; Pang, Ya Jun

  • Author_Institution
    Nat. Key Lab. of Tunable Laser Technol., Harbin Inst. of Technol., Harbin, China
  • fYear
    2011
  • fDate
    12-16 Oct. 2011
  • Firstpage
    236
  • Lastpage
    239
  • Abstract
    This paper puts forwards a novel method of second harmonic of multi-beam laser heterodyne measurement for the thickness of the glass, which is based on the combination of Doppler effect and heterodyne technology, loaded the information of the thickness to the frequency difference of the multi-beam laser heterodyne signal by frequency modulation of the oscillating mirror, which is in the light path. Heterodyne signal frequency can be obtained by fast Fourier transform, and can obtain values of the thickness accurately after the multi-beam laser heterodyne signal demodulation. This method is used for simulate values of different thickness of the glass through numerical simulation of MATLAB and the obtained result shows that maximal relative error is less than 0.02%.
  • Keywords
    Doppler effect; Fourier transform optics; demodulation; fast Fourier transforms; frequency modulation; glass; heterodyne detection; laser mirrors; mathematics computing; measurement by laser beam; numerical analysis; optical harmonic generation; optical information processing; optical modulation; optical signal detection; physics computing; thickness measurement; Doppler effect; MATLAB; SiO2; fast Fourier transform; frequency modulation; glass thickness measurement; heterodyne signal demodulation; multibeam laser heterodyne; numerical simulation; oscillating mirror; second harmonic; Frequency measurement; Glass; Harmonic analysis; Laser beams; Measurement by laser beam; Mirrors; Thickness measurement; Fourier analysis; Heterodyne; Nondestructive testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Optoelectronics and Microelectronics Technology (AISOMT), 2011 Academic International Symposium on
  • Conference_Location
    Harbin
  • Print_ISBN
    978-1-4577-0794-0
  • Type

    conf

  • DOI
    10.1109/AISMOT.2011.6159362
  • Filename
    6159362