DocumentCode :
3404860
Title :
EMI shielding of conductive gaskets in corrosive environments
Author :
Denny, Hugh ; Shouse, Kenneth
Author_Institution :
Georgia Tech. Res. Inst., Atlanta, GA, USA
fYear :
1990
fDate :
21-23 Aug 1990
Firstpage :
20
Lastpage :
24
Abstract :
The environments were selected to simulate a controlled indoor environment; a temperate outdoor environment; and shipboard conditions. The gasket shielding performance was measured using the surface transfer impedance method. The results indicate that the spiral type gaskets perform best, both in terms of initial performance, and resistance of degradation with corrosion. The O-ring type elastomeric gaskets exhibited the worst degradation with weathering, probably due more to the degradation of its initially superior joint geometry. The flat cut-type elastomeric gaskets performed the worst in terms of initial performance. Oriented arrays of wire and knitted wire mesh types were also studied, and they showed similar performance, midway between that of the spiral and the elastomeric gaskets. The results of the experiments indicate that the oriented array type may have a problem with crevice corrosion effects. The benefits and costs associated with integral environmental seals were also studied
Keywords :
corrosion testing; elastomers; electromagnetic interference; environmental degradation; magnetic shielding; seals (stoppers); EMI shielding; O-ring type elastomeric gaskets; conductive gaskets; controlled indoor environment; corrosive environments; crevice corrosion effects; electromagnetic interference; flat cut-type elastomeric gaskets; gasket shielding performance; integral environmental seals; joint geometry; knitted wire mesh; oriented array type; shipboard conditions; spiral type gaskets; surface transfer impedance; temperate outdoor environment; Corrosion; Degradation; Electrical resistance measurement; Electromagnetic interference; Gaskets; Impedance measurement; Indoor environments; Spirals; Temperature control; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 1990. Symposium Record., 1990 IEEE International Symposium on
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-7264-6
Type :
conf
DOI :
10.1109/ISEMC.1990.252725
Filename :
252725
Link To Document :
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