Title :
A 2 GHz effective sampling frequency K-Delta-1-Sigma analog-to-digital converter
Author :
Labaziewicz, Andrew ; Baker, R. Jacob
Author_Institution :
Dept. of Electr. & Comput. Eng., Boise State Univ., Boise, ID, USA
Abstract :
As CMOS technology scales to nanometer dimensions, analog-to-digital converter (ADC) design has become increasingly more challenging. This is mainly due to the increased transistor leakage currents, process variations, and poor matching. The K-Delta-1-Sigma (KD1S) modulator was proposed as a practical solution for designing high-speed ADCs in nanometer CMOS processes. This paper presents an 8-path KD1S modulator with an effective sampling frequency of 2 GHz derived from a 250 MHz input clock. The simulation results confirm the true first-order noise shaping of the modulator. The simulated SNR is 44.95 dB and the simulated SNDR is 44.41 dB corresponding to Neff = 7.17 bits with a conversion bandwidth of 15.625 MHz.
Keywords :
CMOS integrated circuits; analogue-digital conversion; delta-sigma modulation; high-speed integrated circuits; leakage currents; nanoelectronics; sampling methods; 8-path KD1S modulator; ADC design; CMOS technology; K-Delta-1-Sigma modulator; K-Delta-1-sigma analog-to-digital converter; analog-to-digital converter design; conversion bandwidth; first-order noise shaping; frequency 2 GHz; high-speed ADC; nanometer CMOS processes; nanometer dimensions; process variations; sampling frequency; simulated SNDR; transistor leakage currents; CMOS integrated circuits; Latches; Narrowband; Silicon; Switches; K-delta-1-sigma ADC; analog-to-digital converter; delta-sigma modulation; noise shaping; time-interleaved data converters; wideband ADC;
Conference_Titel :
Circuits and Systems (MWSCAS), 2011 IEEE 54th International Midwest Symposium on
Conference_Location :
Seoul
Print_ISBN :
978-1-61284-856-3
Electronic_ISBN :
1548-3746
DOI :
10.1109/MWSCAS.2011.6026453