• DocumentCode
    3405283
  • Title

    Vacuum switch-disconnectors : 1. Dielectric behaviour

  • Author

    Schellekens, H. ; Henon, A. ; Picot, P.

  • Author_Institution
    Medium Voltage Dev., Schneider Electr., Varces
  • Volume
    1
  • fYear
    2008
  • fDate
    15-19 Sept. 2008
  • Firstpage
    149
  • Lastpage
    152
  • Abstract
    This study on vacuum switch-disconnectors addresses two major questions: dielectric behaviour of the VI and the reliability in a practical situation. In the experimental study, the ageing of a specially designed vacuum switch-disconnector is studied. Several internal design parameters (shape of the shields, contacts and contact gap) are varied. The ageing of VIpsilas is simulated by no-load switching, by load current switching as well as short-circuit closing; the dielectric behaviour is analysed by applying a lightning impulse voltage after each operation. A total of 200 operations are performed on each single VI out of a series of 10 interrupters. It is demonstrated that : (1) no-load switching and nominal current switching donpsilat change the dielectric behaviour; the breakdown probability can be described by a Gaussian distribution with as main characteristic that the standard deviation is about 16% of the mean breakdown value. (2) Closing in on short circuit leads to a temporary reduction of the breakdown voltage; a single interruption of the load current permits to restore the original breakdown strength.
  • Keywords
    Gaussian distribution; vacuum interrupters; Gaussian distribution; dielectric behaviour; lightning impulse voltage; load current switching; no-load switching; nominal current switching; short-circuit closing; vacuum switch-disconnectors; Aging; Breakdown voltage; Contacts; Dielectric breakdown; Electric breakdown; Medium voltage; Switches; Switching circuits; Testing; Vacuum breakdown;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Discharges and Electrical Insulation in Vacuum, 2008. ISDEIV 2008. 23rd International Symposium on
  • Conference_Location
    Bucharest
  • ISSN
    1093-2941
  • Print_ISBN
    978-973-755-382-9
  • Electronic_ISBN
    1093-2941
  • Type

    conf

  • DOI
    10.1109/DEIV.2008.4676741
  • Filename
    4676741