DocumentCode :
3405283
Title :
Vacuum switch-disconnectors : 1. Dielectric behaviour
Author :
Schellekens, H. ; Henon, A. ; Picot, P.
Author_Institution :
Medium Voltage Dev., Schneider Electr., Varces
Volume :
1
fYear :
2008
fDate :
15-19 Sept. 2008
Firstpage :
149
Lastpage :
152
Abstract :
This study on vacuum switch-disconnectors addresses two major questions: dielectric behaviour of the VI and the reliability in a practical situation. In the experimental study, the ageing of a specially designed vacuum switch-disconnector is studied. Several internal design parameters (shape of the shields, contacts and contact gap) are varied. The ageing of VIpsilas is simulated by no-load switching, by load current switching as well as short-circuit closing; the dielectric behaviour is analysed by applying a lightning impulse voltage after each operation. A total of 200 operations are performed on each single VI out of a series of 10 interrupters. It is demonstrated that : (1) no-load switching and nominal current switching donpsilat change the dielectric behaviour; the breakdown probability can be described by a Gaussian distribution with as main characteristic that the standard deviation is about 16% of the mean breakdown value. (2) Closing in on short circuit leads to a temporary reduction of the breakdown voltage; a single interruption of the load current permits to restore the original breakdown strength.
Keywords :
Gaussian distribution; vacuum interrupters; Gaussian distribution; dielectric behaviour; lightning impulse voltage; load current switching; no-load switching; nominal current switching; short-circuit closing; vacuum switch-disconnectors; Aging; Breakdown voltage; Contacts; Dielectric breakdown; Electric breakdown; Medium voltage; Switches; Switching circuits; Testing; Vacuum breakdown;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Discharges and Electrical Insulation in Vacuum, 2008. ISDEIV 2008. 23rd International Symposium on
Conference_Location :
Bucharest
ISSN :
1093-2941
Print_ISBN :
978-973-755-382-9
Electronic_ISBN :
1093-2941
Type :
conf
DOI :
10.1109/DEIV.2008.4676741
Filename :
4676741
Link To Document :
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