DocumentCode :
3405488
Title :
Using Walsh Functions In Electrical Impedance Tomography
Author :
Woo, Eung Je ; Pallas-areny, Ramon ; Webster, John G. ; Tompkins, Willis J.
Author_Institution :
University of Wisconsin-Madison
fYear :
1990
fDate :
1-4 Nov 1990
Firstpage :
124
Lastpage :
125
Keywords :
Conductivity; Current measurement; Electric variables measurement; Image reconstruction; Imaging phantoms; Impedance measurement; Instruments; Symmetric matrices; Tomography; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 1990., Proceedings of the Twelfth Annual International Conference of the IEEE
Print_ISBN :
0-87942-559-8
Type :
conf
DOI :
10.1109/IEMBS.1990.691000
Filename :
691000
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3405488
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