• DocumentCode
    3405572
  • Title

    Characteristic number regression for facial feature extraction

  • Author

    Yuntao Li ; Xin Fan ; Risheng Liu ; Yuyao Feng ; Zhongxuan Luo ; Zezhou Li

  • Author_Institution
    Dalian Univ. of Technol., Dalian, China
  • fYear
    2015
  • fDate
    June 29 2015-July 3 2015
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Facial feature extraction plays an important role in many multimedia and vision applications. Recent regression methods for extraction lack the explicit shape constraints for faces, and require a large number of facial images covering great appearance variations. This paper introduces a novel projective invariant, named characteristic number (CN), to explicitly characterize the intrinsic geometries of facial points shared by human faces, which is inherently invariant to pose changes. By further developing a shape-to-gradient regression framework, we provide a robust and efficient feature extractor for facial images in the wild. The computation of our model can be successfully addressed by learning the descent directions using point-CN pairs without the need of large collections for appearance training. Extensive experiments on challenging benchmark data sets demonstrate the effectiveness of our proposed detector against other state-of-the-art approaches.
  • Keywords
    face recognition; feature extraction; image colour analysis; regression analysis; shape recognition; characteristic number regression; facial feature extraction; facial images; facial points intrinsic geometries; feature extractor; human faces; multimedia applications; point-CN pairs; pose changes; projective invariant; regression methods; shape-to-gradient regression framework; vision applications; Active appearance model; Facial features; Feature extraction; Geometry; Robustness; Shape; Training; Facial feature extraction; characteristic number; projective invariant; regression;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multimedia and Expo (ICME), 2015 IEEE International Conference on
  • Conference_Location
    Turin
  • Type

    conf

  • DOI
    10.1109/ICME.2015.7177496
  • Filename
    7177496